Conference Information
IIRW 2016: IEEE International Integrated Reliability Workshop
http://www.iirw.orgSubmission Date: |
2016-07-25 Extended |
Notification Date: |
|
Conference Date: |
2016-10-09 |
Location: |
Stanford Sierra, California, USA |
Viewed: 9002 Tracked: 0 Attend: 0
Call For Papers
Scope We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: Designing-in reliability (products, circuits, systems, processes) Resistive memory: degradation mechanisms Deep sub-micron transistor and circuit reliability Customer product reliability requirements / manufacturer reliability tasks Root cause defects, physical mechanisms, and simulations Wafer level reliability tests, test approaches, and reliability test structures Abstract Submission Please prepare your two-page extended abstract (maximum two pages including figures) in pdf format, and submit it to the following URL: https://easychair.org/conferences/?conf=iirw2016 Please follow the IEEE template when preparing your abstract. All submissions will be acknowledged by email within one week. If you do not receive acknowledgement of your submission, please contact the Technical Program Chair. Your abstract should state clearly and concisely the results of your work and why they are significant. Representative data and figures that support your proposal are REQUIRED. Additional Information For further information please contact the Technical Program Chair: Tom Kopley, Fairchild Email: tpc.iirw2016@gmail.com
Last updated by Xin Yao in 2016-07-24
Related Conferences
Short | Full Name | Submission | Conference |
---|---|---|---|
DMCSE | International Conference on Data Mining, Computing and Software Engineering | 2024-10-31 | 2024-11-22 |
SISAP | International Conference on Similarity Search and Applications | 2020-05-01 | 2020-09-30 |
SafeComp | International Conference on Computer Safety, Reliability and Security | 2024-02-04 | 2024-09-17 |
IRI | International Conference on Information Reuse & Integration for Data Science | 2023-05-08 | 2023-08-04 |
ACITY | International Conference on Advances in Computing and Information technology | 2022-12-10 | 2022-12-23 |
IC3e | IEEE Conference on e-Learning, e-Management and e-Services | 2020-07-31 | 2020-11-17 |
SIELA | International Symposium on Electrical Apparatus and Technologies | 2024-02-15 | 2024-06-12 |
IPTPS | International workshop on Peer-To-Peer Systems | 2010-04-27 | |
CP | International Conference on Principles and Practice of Constraint Programming | 2024-04-18 | 2024-09-02 |
CONIT | International Conference on Intelligent Technologies | 2023-04-30 | 2023-06-23 |
Related Journals
CCF | Full Name | Impact Factor | Publisher | ISSN |
---|---|---|---|---|
Digital Threats: Research and Practice | ACM | 2576-5337 | ||
Nano Energy | 16.80 | Elsevier | 2211-2855 | |
Nano Today | 13.20 | Elsevier | 1748-0132 | |
Random Structures & Algorithms | 0.900 | Wiley-Blackwell | 1042-9832 | |
Games and Culture | 2.400 | SAGE | 1555-4120 | |
International Journal of E-Learning and Educational Technologies in the Digital Media | SDIWC | 2410-0439 | ||
IEEE Pervasive Computing | 1.600 | IEEE | 1536-1268 | |
Journal of Organizational Computing and Electronic Commerce | 2.000 | Taylor & Francis | 1091-9392 | |
a | IEEE/ACM Transactions on Networking | 3.000 | IEEE/ACM | 1063-6692 |
Social Network Analysis and Mining | 2.300 | Springer | 1869-5450 |
Full Name | Impact Factor | Publisher |
---|---|---|
Digital Threats: Research and Practice | ACM | |
Nano Energy | 16.80 | Elsevier |
Nano Today | 13.20 | Elsevier |
Random Structures & Algorithms | 0.900 | Wiley-Blackwell |
Games and Culture | 2.400 | SAGE |
International Journal of E-Learning and Educational Technologies in the Digital Media | SDIWC | |
IEEE Pervasive Computing | 1.600 | IEEE |
Journal of Organizational Computing and Electronic Commerce | 2.000 | Taylor & Francis |
IEEE/ACM Transactions on Networking | 3.000 | IEEE/ACM |
Social Network Analysis and Mining | 2.300 | Springer |
Recommendation