会議情報
EPTC 2018: Electronics Packaging Technology Conference
https://www.eptc-ieee.net/提出日: |
2018-07-27 Extended |
通知日: |
2018-08-15 |
会議日: |
2018-12-04 |
場所: |
Singapore |
年: |
20 |
閲覧: 10827 追跡: 0 出席: 0
論文募集
CONFERENCE TOPICS Advanced Packaging: Advanced Flip-chip, 2.5D & 3D,PoP, embedded passives & actives on substrates, System in Packaging, embedded chip packaging technologies, Panel level packaging, RF, Microwave & Millimeter-wave, Power and Rugged Electronics Packaging etc. TSV/Wafer Level Packaging: Wafer level packaging ( Fan in/Fan out), embedded chip packaging, 2.5D/3D integration, TSV, Silicon & Glass interposer, RDL, bumping technologies, etc. Interconnection Technologies: Au/Ag/Cu/Al Wire-bond / Wedge bond technology, Flip-chip & Cu pillar, solder alternatives (ICP, ACP, ACF, NCP, ICA), Cu to Cu, Wafer level bonding & die attachment (Pb-free) etc. Emerging Technologies: Packaging technologies for MEMS, biomedical, optoelectronics, Internet of things, photo voltaic, printed electronics, wearable electronics, Photonics, LED, etc. Materials and Processing: advanced materials such 3D materials, photoresist, polymer dielectrics, solder materials, die attach, underfill, Substrates, Leadframes, PCB etc for advanced packaging, and assembly processes using advanced materials. Equipment and Process Automation: new processes development, equipment automation, equipment hardware development/ improvements, data analytics, in-situ metrology. Electrical Simulations & Characterization: Power plane modeling, signal integrity analysis of package. 2D/2.5D/3D package level high-speed signal design, characterization and test methodologies, etc. Mechanical Modeling & Simulations: Thermo-mechanical, moisture, fracture, fatigue, vibration, shock and drop modeling, Chip-package interaction, etc. Thermal Characterization & Cooling Solutions: Thermal modeling and simulation, component, system and product level thermal management and characterization. Quality, Reliability & Failure Analysis: Component, board, system and product level reliability assessment, Interfacial adhesion, accelerated testing, failure characterization, etc.
最終更新 Dou Sun 2018-07-23
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---|---|---|---|
Signal | International Conference on Signal and Image Processing | 2023-01-07 | 2023-03-25 |
CYBI | International Conference on Cybernetics & Informatics | 2022-05-14 | 2022-05-28 |
ATCES | International Conference on Aerospace Technology, Communications and Energy Systems | 2022-08-25 | 2022-09-23 |
MLTEC | International Conference on Machine Learning Techniques | 2022-11-05 | 2022-11-19 |
JCCAR | International Joint Conference on Control, Automation and Robotics | 2020-03-25 | 2021-04-16 |
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関連仕訳帳
CCF | 完全な名前 | インパクト ・ ファクター | 出版社 | ISSN |
---|---|---|---|---|
Technology and Health Care | 1.400 | IOS Press | 0928-7329 | |
Cybernetics and Systems Analysis | 0.500 | Springer | 1060-0396 | |
Photonics and Nanostructures - Fundamentals and Applications | 2.500 | Elsevier | 1569-4410 | |
Journal of Biomedical Semantics | 1.600 | Springer | 2041-1480 | |
Law, Innovation and Technology | Taylor & Francis | 1757-9961 | ||
International Journal of Control Theory and Computer Modeling | AIRCC | 2319-4138 | ||
ICT Express | 4.100 | Elsevier | 2405-9595 | |
IEEE Control Systems Letters | 2.400 | IEEE | 2475-1456 | |
Journal of the Association for Information Science and Technology | 2.800 | John Wiley & Sons | 2330-1643 | |
b | Computer-Aided Design | 3.000 | Elsevier | 0010-4485 |
完全な名前 | インパクト ・ ファクター | 出版社 |
---|---|---|
Technology and Health Care | 1.400 | IOS Press |
Cybernetics and Systems Analysis | 0.500 | Springer |
Photonics and Nanostructures - Fundamentals and Applications | 2.500 | Elsevier |
Journal of Biomedical Semantics | 1.600 | Springer |
Law, Innovation and Technology | Taylor & Francis | |
International Journal of Control Theory and Computer Modeling | AIRCC | |
ICT Express | 4.100 | Elsevier |
IEEE Control Systems Letters | 2.400 | IEEE |
Journal of the Association for Information Science and Technology | 2.800 | John Wiley & Sons |
Computer-Aided Design | 3.000 | Elsevier |
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