Basic Information
Name: T Sc
Institution: Anhui University
Registration: 2018-06-09
Score: 354
Tracked Conferences
CCF | CORE | QUALIS | Short | Full Name | Submission | Notification | Conference |
---|---|---|---|---|---|---|---|
a | a* | a1 | AAAI | AAAI Conference on Artificial Intelligence | 2024-08-07 | 2024-12-09 | 2025-02-25 |
b | a | a1 | EMNLP | Conference on Empirical Methods in Natural Language Processing | 2024-06-15 | 2024-09-20 | 2024-11-12 |
a | a1 | NeurIPS | Conference on Neural Information Processing Systems | 2024-05-15 | 2024-09-25 | 2024-12-09 |
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Short | Full Name | Submission | Conference |
---|---|---|---|
AAAI | AAAI Conference on Artificial Intelligence | 2024-08-07 | 2025-02-25 |
EMNLP | Conference on Empirical Methods in Natural Language Processing | 2024-06-15 | 2024-11-12 |
NeurIPS | Conference on Neural Information Processing Systems | 2024-05-15 | 2024-12-09 |
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Attend Conferences
CCF | CORE | QUALIS | Short | Full Name | Conference | Location |
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Tracked Journals
CCF | Full Name | Impact Factor | Publisher | ISSN |
---|---|---|---|---|
b | IEEE Transactions on Cybernetics | 9.400 | IEEE | 2168-2267 |
a | The VLDB Journal | 2.800 | Springer | 1066-8888 |
a | IEEE Transactions on Knowledge and Data Engineering | 8.900 | IEEE | 1041-4347 |
a | ACM Transactions on Database Systems | 2.200 | ACM | 0362-5915 |
a | Artificial Intelligence | 5.100 | Elsevier | 0004-3702 |
a | Journal of Machine Learning Research | Microtome Publishing | 1532-4435 | |
a | IEEE Transactions on Pattern Analysis and Machine Intelligence | 20.80 | IEEE | 0162-8828 |
Full Name | Impact Factor | Publisher |
---|---|---|
IEEE Transactions on Cybernetics | 9.400 | IEEE |
The VLDB Journal | 2.800 | Springer |
IEEE Transactions on Knowledge and Data Engineering | 8.900 | IEEE |
ACM Transactions on Database Systems | 2.200 | ACM |
Artificial Intelligence | 5.100 | Elsevier |
Journal of Machine Learning Research | Microtome Publishing | |
IEEE Transactions on Pattern Analysis and Machine Intelligence | 20.80 | IEEE |
Followed Researchers
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Tracked Jobs
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Viewed Conferences
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Viewed Journals
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